Advanced reduction processes (ARPs) have emerged as a promising method for destruction of persistent per- and polyfluoroalkyl substances (PFAS) in water due to the generation of short-lived and highly reductive hydrated electrons (eaq). This study provides a critical review on the mechanisms and performance of reductive destruction of PFAS with eaq. Unique properties of eaq and its generation in different ARP systems, particularly UV/sulfite and UV/iodide, are overviewed.


Su-no-G / Public domain

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